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Optical Characteristic Measuring Apparatus, Optical Characteristic Measuring Method, and Optical Characteristic Measuring Unit

机译:光学特性测量装置,光学特性测量方法和光学特性测量单元

摘要

An optical characteristic measuring device includes: an optical system (10), a light intensity information acquisition unit (40) for acquiring light intensity information on the light to be measured, and an operation process unit (60). The optical system (10) introduces the light emitted from a light source (12) to a sample (100) via a polarizer (22), a ½ wavelength plate (24), and a first ¼ wavelength plate (26), and introduces the light emitted from the sample (100) to a reception unit (14) via a second ¼ wavelength plate (34) and a detector (36). The ½ wavelength plate (24), the first and the second ¼ wavelength plate (26, 34) and the detector (36) are configured so as to be rotated. The light intensity information
机译:一种光学特性测量装置,包括:光学系统( 10 ),用于获取有关被测光的光强度信息的光强度信息获取单元( 40 ),以及操作处理单元( 60 )。光学系统( 10 )通过偏振器( 10)将光源( 12 )发出的光引入到样品( 100 )中。 > 22 ),1/2波长板( 24 )和第一个1/4波长板( 26 ),并引入样品发出的光(< B> 100 )通过第二个1/4波长板( 34 )和检测器( 36 )到达接收单元( 14 ) )。配置了1/2波长板( 24 ),第一和第二1/4波长板( 26、34 )以及检测器( 36 )以便旋转。光强度信息

著录项

  • 公开/公告号US2010103417A1

    专利类型

  • 公开/公告日2010-04-29

    原文格式PDF

  • 申请/专利权人 YUKITOSHI OTANI;MIZUE EBISAWA;

    申请/专利号US20070225384

  • 发明设计人 YUKITOSHI OTANI;MIZUE EBISAWA;

    申请日2007-03-16

  • 分类号G01J4/00;

  • 国家 US

  • 入库时间 2022-08-21 18:54:23

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