首页> 外国专利> SCANNING OPTICAL SYSTEM UNIT, APPARATUS OF MEASURING OPTICAL CHARACTERISTIC, METHOD OF MEASURING OPTICAL CHARACTERISTIC, METHOD OF ADJUSTING SCANNING OPTICAL SYSTEM UNIT AND IMAGE FORMING APPARATUS

SCANNING OPTICAL SYSTEM UNIT, APPARATUS OF MEASURING OPTICAL CHARACTERISTIC, METHOD OF MEASURING OPTICAL CHARACTERISTIC, METHOD OF ADJUSTING SCANNING OPTICAL SYSTEM UNIT AND IMAGE FORMING APPARATUS

机译:扫描光学系统单元,光学特性的测量装置,光学特性的测量方法,调整扫描光学系统的单元和图像形成装置

摘要

PROBLEM TO BE SOLVED: To measure the positions of beams between stations without dropping a rotating polygon body even when a scanning optical system unit of a type that emits a scanning line (light beam) from the lower to upper positions (from downstream to upstream sides in the gravitational direction) is turned over upside down.;SOLUTION: The scanning optical system unit is designed by assuming that the unit is installed so that the light beam is emitted from the downstream to the upstream sides in the gravitational direction, and a member is provided for preventing the dropout of the rotating polygon body when the unit is install in a way that the light beam is emitted from the upstream to the downstream sides in the gravitational direction.;COPYRIGHT: (C)2008,JPO&INPIT
机译:解决的问题:即使在从下到上位置(从下游到上游侧)发射扫描线(光束)的类型的扫描光学系统单元中,也可以在不掉落旋转多面体的情况下测量站之间的光束位置解决方案:扫描光学系统单元的设计是假设安装该单元的,以使光束从重力方向的下游侧发射到上游侧,为防止旋转多角形物体掉落而设置,该单元的安装方式是沿重力方向从上游侧向下游侧发射光束。;版权所有:(C)2008,JPO&INPIT

著录项

  • 公开/公告号JP2008070764A

    专利类型

  • 公开/公告日2008-03-27

    原文格式PDF

  • 申请/专利权人 RICOH CO LTD;

    申请/专利号JP20060251021

  • 发明设计人 SHIMIZU KENICHI;

    申请日2006-09-15

  • 分类号G02B26/10;G02B26/12;B41J2/44;

  • 国家 JP

  • 入库时间 2022-08-21 20:23:48

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