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Bright-field/dark-field detector with integrated electron energy spectrometer

机译:集成电子能谱仪的明场/暗场探测器

摘要

One embodiment relates to an electron beam apparatus including an electron beam column, an immersion objective lens, a Wien filter, a bright-field/dark-field detector, and an electron energy spectrometer. The bright-field/dark-field detector comprising an opening configured to pass through bright field secondary electrons and one or more detector segments around the opening configured to detect dark field secondary electrons. The electron energy spectrometer configured to detect the bright field secondary electrons passed through the opening and to measure an energy spectrum of the bright field secondary electrons. Other embodiments, aspects and features are also disclosed.
机译:一个实施例涉及一种电子束设备,该电子束设备包括电子束柱,浸没物镜,维恩滤光器,明场/暗场检测器和电子能谱仪。该明场/暗场检测器包括被配置为穿过明场二次电子的开口和围绕该开口被配置为检测暗场二次电子的一个或多个检测器段。电子能谱仪被配置为检测穿过开口的明场二次电子并测量明场二次电子的能谱。还公开了其他实施例,方面和特征。

著录项

  • 公开/公告号US7755043B1

    专利类型

  • 公开/公告日2010-07-13

    原文格式PDF

  • 申请/专利权人 ALEXANDER J. GUBBENS;

    申请/专利号US20070888380

  • 发明设计人 ALEXANDER J. GUBBENS;

    申请日2007-07-31

  • 分类号G01N23/00;

  • 国家 US

  • 入库时间 2022-08-21 18:52:18

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