首页> 外国专利> PRESSURE DETECTION APPARATUS, JOSEPHSON DEVICE, AND SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE THAT INCLUDE SUPERCONDUCTOR THIN FILM THAT UNDERGOES TRANSITION FROM SUPERCONDUCTOR TO INSULATOR BY PRESSURE

PRESSURE DETECTION APPARATUS, JOSEPHSON DEVICE, AND SUPERCONDUCTING QUANTUM INTERFERENCE DEVICE THAT INCLUDE SUPERCONDUCTOR THIN FILM THAT UNDERGOES TRANSITION FROM SUPERCONDUCTOR TO INSULATOR BY PRESSURE

机译:压力检测装置,Josephson装置和超导量子干扰装置,其中包括通过压力从超导体过渡到绝缘体的超导体薄膜

摘要

A pressure detection apparatus (30) detects, among a plurality of superconductor thin films (11 to 14) having different critical pressures at which a transition from a superconductor to an insulator occurs, the superconductor thin films (12 to 14) that have undergone the transition to the insulator with ammeters (242, 252, 262); and to detect, as an internal pressure of a housing (10), the maximum critical pressure among the critical pressures of the detected superconductor thin films (12 to 14).
机译:压力检测设备( 30 )在具有不同临界压力的多个超导薄膜( 11 14 )中检测转变的临界压力。从超导体到绝缘体的过程中,已经用安培计( 242、252、262)过渡到绝缘体的超导体薄膜( 12 14 );并将检测到的超导体薄膜的临界压力( 12 14)中的最大临界压力检测为壳体的内部压力( 10 )。

著录项

  • 公开/公告号US2010171098A1

    专利类型

  • 公开/公告日2010-07-08

    原文格式PDF

  • 申请/专利权人 TAKASHI SUZUKI;

    申请/专利号US20080601790

  • 发明设计人 TAKASHI SUZUKI;

    申请日2008-07-31

  • 分类号H01L39/12;

  • 国家 US

  • 入库时间 2022-08-21 18:51:40

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