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Method to chemically remove metal impurities from polycide gate sidewalls

机译:从多晶硅化物栅极侧壁化学去除金属杂质的方法

摘要

An embodiment includes a process of forming a gate stack that acts to resist the redeposition to the semiconductive substrate of mobilized metal such as from a metal gate electrode. An embodiment also relates to a system that achieves the process. An embodiment also relates to a gate stack structure that provides a composition that resists the redeposition of metal during processing and field use.
机译:一个实施例包括形成栅叠层的过程,该栅叠层用于抵抗再迁移到诸如金属栅电极之类的动员金属向半导体衬底的再沉积。一个实施例还涉及实现该过程的系统。实施例还涉及一种栅极堆叠结构,其提供了在处理和现场使用期间抵抗金属再沉积的成分。

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