Method and apparatus for performing turnaround testing on a digital signal 1 board

摘要

A test adaptor for performing turnaround testing on a T1 board that has a plurality of jack receptacles disposed therein. The test adaptor is comprised of a bracket, a plurality of openings, and a plurality of test plugs. The bracket has a length and a width complimentary to the length and the width of an end of a T1 board. The plurality of openings disposed in the bracket are spaced apart from each other by predetermined distances that are complimentary to the spacing between the plurality of jack receptacles disposed in the T1 board. The plurality of test plugs are mounted within the plurality of openings in the bracket such that the plurality of test plugs can be engaged with the plurality of jack receptacles substantially simultaneously and with a single mechanical step.