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Solid high aspect ratio via hole used for burn-in boards, wafer sort probe cards, and package test load boards with electronic circuitry

机译:实心高纵横比通孔,用于老化板,晶圆分选探针卡和带有电子电路的封装测试负载板

摘要

A method, and apparatus resulting from the method, for fabricating a circuit board suitable for mounting electronic components. The method includes drilling a plurality of through-holes in a plurality of dielectric sheets, forming a conductive film on at least one side of each of the plurality of dielectric sheets, and substantially filling each of the plurality of through holes with a conductive material. The conductive material is both electrically and thermally uninterrupted from a first face to a second face of each of the plurality of dielectric sheets. The plurality of dielectric sheets are then sequentially mounted, on atop another, to form the circuit board. The sequential mounting step is performed after the steps of drilling the plurality of through-holes, forming the conductive layer, and substantially filling the plurality of through-holes.
机译:一种方法和由该方法产生的设备,用于制造适于安装电子部件的电路板。该方法包括:在多个电介质片中钻多个通孔;在多个电介质片中的每个电介质片的至少一侧上形成导电膜;以及用导电材料基本填充多个通孔中的每个。导电材料从多个介电片中的每一个的第一面到第二面在电和热方面均不间断。然后将多个介电片顺序地安装在另一个之上,以形成电路板。在钻出多个通孔,形成导电层并基本填充多个通孔的步骤之后执行顺序安装步骤。

著录项

  • 公开/公告号US7750650B2

    专利类型

  • 公开/公告日2010-07-06

    原文格式PDF

  • 申请/专利权人 ROMI O. MAYDER;

    申请/专利号US20070685866

  • 发明设计人 ROMI O. MAYDER;

    申请日2007-03-14

  • 分类号G01R1/02;H01R12/04;

  • 国家 US

  • 入库时间 2022-08-21 18:48:16

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