Testing system and related testing method for an analog design under test

摘要

A testing system includes an integrated circuit having an analog design under test and a processor; an digital-to-analog converter (DAC), coupled to the analog design under test and the processor, for converting a digital testing sequence output of the processor into an analog testing sequence fed into the analog design under test; a analog-to-digital converter (ADC), coupled to the analog design under test and the processor, for converting an analog testing response of the analog design under test into a digital testing response fed into the processor; and an external tester, coupled to the processor of the integrated circuit, for sequentially outputting a program sequence to the processor; wherein the processor executes the program sequence without un-predictable conditional jump to get a testing result of the testing system and then outputs the testing result to the external tester.