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Memory controller with a self-test function, and method of testing a memory controller
Memory controller with a self-test function, and method of testing a memory controller
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机译:具有自检功能的存储器控制器以及测试存储器控制器的方法
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摘要
A memory controller with a self-test function includes a test controlling unit configured to generate test data in a test mode, a data transmission unit configured to generate a data read timing signal to transmit the data read timing signal and the generated test data synchronized with the data read timing signal, and a data input/output (I/O) unit configured to feedback the transmitted test data and the transmitted data read timing signal to the data transmission unit, such that the data transmission unit receives fed-back test data and a fed-back data read timing signal. The data transmission unit reads the fed-back test data based on the fed-back data read timing signal, and the test controlling unit compares the fed-back test data with the generated test data. Therefore, the memory controller may perform a fast self-test.
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