首页> 外国专利> A DEVICE FOR THE MEASURING VELOCITY AND ATTENUATION OF ULTRASONIC WAVES IN SOLID SAMPLE AT LOW TEMPERATURES UPTO 90K

A DEVICE FOR THE MEASURING VELOCITY AND ATTENUATION OF ULTRASONIC WAVES IN SOLID SAMPLE AT LOW TEMPERATURES UPTO 90K

机译:在高达90K的低温下测量固体样品中超声波波的速度和衰减的装置

摘要

A device for the measurement of ultrasonic velocity and attenuation in solid samples at low temperatures, such as over a wide range of temperature from 90 to 303 K which essentially consists of a novel spring loaded arrangement which provides a good contact, gentle and uniform pressure between the crystal and solid sample. The necessary cooling / heating of the sample can be selected depending on the requirements. The device of the present invention makes it possible to measure the ultrasonic velocity and attenuation in solid samples using both through transmission technique and pulse echo method. The above setup also permits use of a low thickness of sample in the order of mm to cm range.
机译:一种用于在低温下(例如在90至303 K的宽温度范围内)测量固体样品中超声波速度和衰减的设备,该设备主要由新颖的弹簧加载装置组成,该装置可提供良好的接触,平缓且均匀的压力晶体和固体样品。可以根据需要选择样品的必要冷却/加热。本发明的装置使得可以通过传输技术和脉冲回波方法两者来测量固体样品中的超声速度和衰减。上述设置还允许使用毫米到厘米范围内的低厚度样品。

著录项

  • 公开/公告号IN236828B

    专利类型

  • 公开/公告日2009-12-04

    原文格式PDF

  • 申请/专利权人

    申请/专利号IN14/DEL/2002

  • 申请日2002-01-10

  • 分类号G01F1/66;

  • 国家 IN

  • 入库时间 2022-08-21 18:45:57

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