Device for measuring the electrical conduction and thermoelectromotive force of semiconductor materials in the temperature range 300à1200K

摘要

the invention refers to systems research phenomena in semiconductor test of electrical loads and semimetale, namely testing electrical and conductibilitatii force termoelectromotoare thermoelectric materials to determine their efficiency in the temperature range 300 ...1200k.device for measuring force of electrical and conductibilitatii termoelectromotoare semiconductor materials in the temperature range 300...1200k contains a metal tube (6), in which are located two thermocouples (11, 12), which contact with the electrical conductors (13), (14, 1 5).the device contains a spring (10), a thermal source and a vacuumare room outside, set above vacuumare from placing sample (13). the device further includes a metal block (2), fixed in a metal muff (1) mounted in a tube of quartz (3) fixed in the upper part of the metal tube (6) by means of the fastener (4) and (5) of bucsei.the device also includes a metal block cell (7) with axial orifice for thermocouple (12), located in the upper part of a quartz tube (8), the bottom of which is fixed on a rigid tube of quartz (19) located inside a quartz tube (9) with the possibility of locomotion of along it. a tube of quartz (20) is fixed inside of the quartz tube (9).the upper part of the quartz tube (9) is fixed on the bottom of the metal tube (6) by means of the fastener (18) and (16), also bucsei bow (10) is placed on the tube (19) between the tubes of quartz (8) and (20).the bottom of the tube of quartz (9) is fixed on the upper part of a metal tube (22) by means of the fastener (21) and bucsei (23). in the metallic block (2) and metal muff (1) is executed, an axial orifice for thermocouple (11).