首页> 外国专利> SIZE DETECTION METHOD FOR PITTING SURFACE DFECTS WITH DUE ACCOUNT FOR CLOSED AREAS

SIZE DETECTION METHOD FOR PITTING SURFACE DFECTS WITH DUE ACCOUNT FOR CLOSED AREAS

机译:封闭区域中因应收账款缺陷而放置表面尺寸的尺寸检测方法

摘要

A size detection method for pitting-like surface defects with due account for closed areas includes picture image analysis according to which with the help of image segmentation they determine areas corresponding to sample defects. On the image segmentation wit the help of multiple-level threshold discrimination they isolate areas corresponding to open defect areas as well as they take into account little informative areas around open defects which along with open defects are extracted by means of division of this image into fragments for each of them they build a local intensity histogram and separate local maximums on it where they form intensity clusters and find their centers. The set value of image segmentation thresholds is selected equal to the mean value of two adjacent cluster centers.
机译:适当考虑封闭区域的点状表面缺陷的尺寸检测方法包括图片图像分析,根据图片图像分析,它们可以借助图像分割来确定与样品缺陷相对应的区域。在多级阈值鉴别的帮助下,在图像分割中,它们将与开放缺陷区域相对应的区域隔离开来,并且不考虑开放缺陷周围的少量信息区域,这些缺陷区域与开放缺陷一起通过将该图像划分为碎片而提取对于他们每个人,他们建立一个局部强度直方图,并在其上分离局部最大值,以形成强度簇并找到其中心。选择图像分割阈值的设定值等于两个相邻聚类中心的平均值。

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号