MOUNT-TYPE TEST DEVICE CAPABLE OF IMPROVING RELIABILITY ABOUT QUALITY OF A MEMORY DEVICE BY COPYING A TEST CONDITION OF VARIOUS MOUNTING ENVIRONMENTS, AND A METHOD THEREOF

摘要

PURPOSE: A mount-type test device and a method thereof are provided to reduce a test process cost due to a feature change and a kind of a CE device or a mother board by storing information about various mother boards to a single storing space.;CONSTITUTION: A capture system(200) captures a signal for a test logic from an external device(1000), and includes a capture device(220) for capturing a test logic and a local storing device(240) for storing the captured signal. A pattern data center(300) is a kind of database including a large capacity storing device(320), and stores various signals captured through the capture system as a logic data for a test. A tester main frame(100) includes a local storing device(120), a tester main board(140), and a header(160). A performance board(400) includes a DUT(Device Under Test). Each component chip or a module chip is mounted to the performance board.;COPYRIGHT KIPO 2010