BURN-IN TEST METHOD OF SEMICONDUCTOR DEVICE FOR DETECTING MICRO BRIDGE BETWEEN ADJACENT BIT LINES

摘要

PURPOSE: A burn-in test method of a semiconductor device is provided to detect micro bridge between first bit line and second bit line by discharging voltage level of the first bit line through the second bit line.;CONSTITUTION: An accelerating voltage is applied in initial partial period of burn-in test. A second bit line(BLe) is maintained in alternate discharging state and charging state. The electric potential of the first bit line is detected.;COPYRIGHT KIPO 2010