SEMICONDUCTOR MEMORY DEVICE FOR HIGH SPEED DATA OUTPUT TEST, CAPABLE OF PREVENTING THE LOSS OF A DATA COVERAGE

摘要

PURPOSE: A semiconductor memory device for high speed data output test is provided to perform a high data output test by selectively outputting odd number data or even number data from each terminal.;CONSTITUTION: A plurality of output buffer parts are connected to a plurality of terminals. An output buffer part comprises a first HSDO buffer(113-1n3), a second HSDO buffer(114-1n4) and buffer selector(111-11n). The first HSDO buffer buffers even number data from data string. The second HSDO buffer buffers odd number data from the data string. A buffer selection unit selectively activates the first and the second buffer.;COPYRIGHT KIPO 2010