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NON VOLATILE MEMORY DEVICE AND A METHOD OF OPERATING THE SAME, CAPABLE OF STORING A COLUMN TEST RESULT THEREIN WITHOUT OUTPUTTING THE COLUMN TEST RESULT TO THE OUTSIDE
NON VOLATILE MEMORY DEVICE AND A METHOD OF OPERATING THE SAME, CAPABLE OF STORING A COLUMN TEST RESULT THEREIN WITHOUT OUTPUTTING THE COLUMN TEST RESULT TO THE OUTSIDE
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机译:非挥发性存储器件及其操作方法,能够存储列测试结果,而不会向外部输出列测试结果
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摘要
PURPOSE: A non volatile memory device and a method of operating the same are provided to reduce a test time by storing failed column address and IO data in the non volatile memory device.;CONSTITUTION: A data comparison unit(351) outputs a clock signal and a fail I/O signal according to a comparison result of first with second data. Controllers(354,355) transfer an inputted address according to the clock signal to a register unit. A data register counter(352) outputs an address counting signal of the register according to the clock signal. An address decoder(353) decodes the register address of the register unit. An address decoder outputs a control signal enabling a corresponding register. A first comparison unit outputs a first comparison signal by using comparison data.;COPYRIGHT KIPO 2010
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