首页> 外国专利> NON VOLATILE MEMORY DEVICE AND A METHOD OF OPERATING THE SAME, CAPABLE OF STORING A COLUMN TEST RESULT THEREIN WITHOUT OUTPUTTING THE COLUMN TEST RESULT TO THE OUTSIDE

NON VOLATILE MEMORY DEVICE AND A METHOD OF OPERATING THE SAME, CAPABLE OF STORING A COLUMN TEST RESULT THEREIN WITHOUT OUTPUTTING THE COLUMN TEST RESULT TO THE OUTSIDE

机译:非挥发性存储器件及其操作方法,能够存储列测试结果,而不会向外部输出列测试结果

摘要

PURPOSE: A non volatile memory device and a method of operating the same are provided to reduce a test time by storing failed column address and IO data in the non volatile memory device.;CONSTITUTION: A data comparison unit(351) outputs a clock signal and a fail I/O signal according to a comparison result of first with second data. Controllers(354,355) transfer an inputted address according to the clock signal to a register unit. A data register counter(352) outputs an address counting signal of the register according to the clock signal. An address decoder(353) decodes the register address of the register unit. An address decoder outputs a control signal enabling a corresponding register. A first comparison unit outputs a first comparison signal by using comparison data.;COPYRIGHT KIPO 2010
机译:目的:提供一种非易失性存储设备及其操作方法,以通过将故障的列地址和IO数据存储在非易失性存储设备中来减少测试时间。组成:数据比较单元(351)输出时钟信号根据第一数据与第二数据的比较结果,输出故障I / O信号。控制器(354,355)根据时钟信号将输入的地址传送到寄存器单元。数据寄存器计数器(352)根据时钟信号输出寄存器的地址计数信号。地址解码器(353)对寄存器单元的寄存器地址进行解码。地址解码器输出使能相应寄存器的控制信号。第一比较单元通过使用比较数据输出第一比较信号。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR20100085657A

    专利类型

  • 公开/公告日2010-07-29

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090005068

  • 发明设计人 LEE WAN SEOB;

    申请日2009-01-21

  • 分类号G11C29/14;G11C29/18;G11C16/06;

  • 国家 KR

  • 入库时间 2022-08-21 18:32:13

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