首页> 外国专利> METHOD FOR CHEMICALLY AND MECHANICALLY POLISHING A PHASE CHANGE MATERIAL, AND A METHOD FOR MANUFACTURING A PHASE CHANGE MEMORY DEVICE, CAPABLE OF OMITTING AN ETCH BACK ETCHING PROCESS

METHOD FOR CHEMICALLY AND MECHANICALLY POLISHING A PHASE CHANGE MATERIAL, AND A METHOD FOR MANUFACTURING A PHASE CHANGE MEMORY DEVICE, CAPABLE OF OMITTING AN ETCH BACK ETCHING PROCESS

机译:用于化学和机械抛光相变材料的方法,以及制造可省略刻蚀回刻工艺的相变存储器的方法

摘要

PURPOSE: A method for chemically and mechanically polishing a phase change material and a method for manufacturing a phase change memory device are provided to reduce the change of composition of the phase change materials.;CONSTITUTION: A phase change material(11) is formed on an active surface of a semiconductor wafer. The phase change material is chemically and mechanically polished by a slurry and a polishing pad. The change of composition of the phase change material is suppressed by controlling the temperature of a contact area between the phase change material and the polishing pad within a preset range.;COPYRIGHT KIPO 2011
机译:目的:提供一种化学和机械抛光相变材料的方法和一种相变存储器件的制造方法,以减少相变材料的组成变化。;组成:在其上形成相变材料(11)半导体晶片的有源表面。相变材料通过浆料和抛光垫进行化学和机械抛光。通过将相变材料和抛光垫之间的接触区域的温度控制在预设范围内,可以抑制相变材料的成分变化。; COPYRIGHT KIPO 2011

著录项

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号