首页> 外国专利> SEMICONDUCTOR PACKAGE AND A METHOD FOR FABRICATING THEREOF, CAPABLE OF IMPROVING THE CONTACT FAIL DUE TO THE DIFFERENCE OF THERMAL EXPANSION COEFFICIENTS BETWEEN A SUBSTRATE AND AN ENCAPSULANT

SEMICONDUCTOR PACKAGE AND A METHOD FOR FABRICATING THEREOF, CAPABLE OF IMPROVING THE CONTACT FAIL DUE TO THE DIFFERENCE OF THERMAL EXPANSION COEFFICIENTS BETWEEN A SUBSTRATE AND AN ENCAPSULANT

机译:半导体封装及其制造方法,由于基质和密封剂之间的热膨胀系数不同,因此能够改善接触失败

摘要

PURPOSE: A semiconductor package and a method for fabricating thereof are provided to improve the reliability of solder joint by forming a stress release layer on a semiconductor substrate.;CONSTITUTION: A semiconductor package comprises a substrate(110), a semiconductor chip(150), a stress release layer(170), and an encapsulant(190). The semiconductor chip is laminated on one side of the substrate. The stress release layer covers one side of the substrate and the semiconductor chip. The stress release layer is formed with an elastic body and silicon. The encapsulant is formed on the stress release layer in order to cover one side of the substrate including the semiconductor chip. The stress release layer and the encpasulant are combined with each other through an adhesive.;COPYRIGHT KIPO 2011
机译:目的:提供一种半导体封装及其制造方法,以通过在半导体衬底上形成应力释放层来提高焊点的可靠性。组成:一种半导体封装,包括衬底(110),半导体芯片(150) ,应力释放层(170)和密封剂(190)。半导体芯片被层压在基板的一侧上。应力释放层覆盖衬底和半导体芯片的一侧。应力释放层由弹性体和硅形成。密封剂形成在应力释放层上,以便覆盖包括半导体芯片的基板的一侧。应力释放层和密封剂通过粘合剂相互结合。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100109042A

    专利类型

  • 公开/公告日2010-10-08

    原文格式PDF

  • 申请/专利权人 HYNIX SEMICONDUCTOR INC.;

    申请/专利号KR20090027424

  • 发明设计人 JOH CHEOL HO;

    申请日2009-03-31

  • 分类号H01L23/28;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:47

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