首页> 外国专利> PROPERTY OF BEING SIMILAR LIKE SANCTIONING THE HIGH VOLTAGE ALTHOUGH THE LOW POWER IS SANCTIONED IS HAD THE MANUFACTURING METHOD OF THE POLYCRYSTALLINE SILICON THIN FILM

PROPERTY OF BEING SIMILAR LIKE SANCTIONING THE HIGH VOLTAGE ALTHOUGH THE LOW POWER IS SANCTIONED IS HAD THE MANUFACTURING METHOD OF THE POLYCRYSTALLINE SILICON THIN FILM

机译:尽管已消除了低功耗,但类似地对高压进行了制裁的性质已经有一种多晶硅薄膜的制造方法

摘要

PURPOSE: The manufacturing method of the polycrystalline silicon thin film the electric field is no need to be sanctioned repetitively. Therefore, the process time can be reduced.;CONSTITUTION: The manufacturing method of the polycrystalline silicon thin film the first insulation layer(20), the amorphous silicon thin film(30), and the second insulation layer(40) and conductive film(50) are formed successively on the substrate(10). The amorphous silicon thin film is crystalized with the high heater which the electric field is sanctioned in the conductive film by using electrode and is created.;COPYRIGHT KIPO 2011
机译:目的:多晶硅薄膜的制造方法不需要重复地批准。因此,可以减少工艺时间。组成:多晶硅薄膜,第一绝缘层(20),非晶硅薄膜(30),第二绝缘层(40)和导电膜(在基板(10)上依次形成50)。非晶硅薄膜通过高加热器结晶,通过使用电极在导电膜中施加电场,从而产生电场。; COPYRIGHT KIPO 2011

著录项

  • 公开/公告号KR20100116062A

    专利类型

  • 公开/公告日2010-10-29

    原文格式PDF

  • 申请/专利权人 ENSILTECH CORPORATION;

    申请/专利号KR20090034791

  • 发明设计人 RO JAE SANG;HONG WON EUI;

    申请日2009-04-21

  • 分类号H01L21/324;H01L21/20;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:42

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