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Method for fabricating active region in semiconductor device using space patterning tech

机译:利用空间图案化技术在半导体器件中制造有源区的方法

摘要

to form an active region of a semiconductor device using the space pattern technique of the present invention sacrifices on a semiconductor substrate, film to form a pattern; Enclosing each side of the sacrificial layer pattern to form a spacer; Step of removing the sacrificial layer pattern to form a ring-type spacers to expose the semiconductor substrate disposed in the inner space; A ring-type spacers to separate and positioned spaced a distance from the first spacer and the first spacer to form a second spacer disposed in the first spacer and the mirror structure; And the first and second etching the exposed portions of the semiconductor substrate, a spacer as an etch mask to the first active region and the first active region and the unit cell areas arranged as a mirror structure including a second active region located apart from each other by a predetermined distance and a step of forming.
机译:使用本发明的空间图案技术形成半导体器件的有源区,在半导体衬底上牺牲膜以形成图案。包围牺牲层图案的每一侧以形成间隔物;去除牺牲层图案以形成环形间隔物以暴露设置在内部空间中的半导体衬底的步骤;环形间隔物,其与第一间隔物和第一间隔物分离并定位隔开,以形成设置在第一间隔物和镜结构中的第二间隔物;并且第一和第二蚀刻半导体衬底的暴露部分,作为蚀刻掩模的隔离物到第一有源区域和第一有源区域以及单位单元区域被布置为包括彼此分开的第二有源区域的镜面结构。预定距离和形成步骤。

著录项

  • 公开/公告号KR100950480B1

    专利类型

  • 公开/公告日2010-03-31

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20080058490

  • 发明设计人 박찬하;

    申请日2008-06-20

  • 分类号H01L21/027;H01L21/76;H01L21/306;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:22

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