首页> 外国专利> CURVED SURFACE MEASURING METHOD TO REDUCE THE TIME FOR MEASURING THE CURVATURE AND CONCENTRICITY OF A CURVED SURFACE

CURVED SURFACE MEASURING METHOD TO REDUCE THE TIME FOR MEASURING THE CURVATURE AND CONCENTRICITY OF A CURVED SURFACE

机译:减少曲面测量曲率和浓度的时间的曲面测量方法

摘要

PURPOSE: A curved surface measuring method is provided to measure the curvature and concentricity of a curved surface using a curved surface measuring apparatus including a main body, a rotating member, and a measuring unit which are in contact with each other.;CONSTITUTION: A curved surface measuring method comprises a step(S100) of setting a curved surface measuring device on an object having a curved surface, wherein the curved surface measuring device includes a rotating member installed on a main body, a fastening member connecting the main body and the rotating member, and a measuring unit which is installed on one side of the rotating member and controlled in length, and a step(S300) of measuring the curvature of the object by rotating the measuring unit around the center of the fastening member and the concentricity of the object by rotating the main body, wherein the bottom surface is in contact with one side of the object.;COPYRIGHT KIPO 2010
机译:目的:提供一种曲面测量方法,以使用包括彼此接触的主体,旋转构件和测量单元的曲面测量设备来测量曲面的曲率和同心度;组成:A曲面测量方法包括将曲面测量设备设置在具有曲面的物体上的步骤(S100),其中曲面测量设备包括安装在主体上的旋转构件,将主体与主体连接的紧固构件。旋转部件;测量单元,其安装在旋转部件的一侧并且长度受控制;以及步骤(S300),其通过围绕紧固部件的中心和同心度旋转测量单元来测量物体的曲率通过旋转主体来旋转物体,其中底面与物体的一侧接触。; COPYRIGHT KIPO 2010

著录项

  • 公开/公告号KR100952360B1

    专利类型

  • 公开/公告日2010-04-09

    原文格式PDF

  • 申请/专利权人 RYU MAN YEOL;

    申请/专利号KR20080099949

  • 发明设计人 RYU MAN YEOL;

    申请日2008-10-13

  • 分类号G01B5/20;G01B5/00;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:17

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