FPGA configuration apparatus for semiconductor test and method for DUT test using the FPGA configuration system

摘要

An FPGA(Field-Programmable Gate Array) configuration system for a semiconductor test and a method is provided to allow reconfiguration of FPGA without stopping ATE by configuring the FPGA with program logic. An FPGA composition system(100) comprises a memory(140), an FPGA(160), a controller, and an FPGA configuration unit(150). A plurality of FPGA configuring information is stored in the memory, and FPGA tests a DUT with the FPGA configuring information. The FPGA configuration command signal is inputted from a user interface unit, and a controller selects one of FPGA configuring information and outputs it.