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Configuration and testing method and system for FPGA chip using bumping process

机译:利用凸块工艺的fpga芯片的配置测试方法及系统

摘要

A configuration and testing method and system for an FPGA chip using a bumping process are disclosed, the method includes creating configuration files for an FPGA chip under test and storing them in a memory; reading, by a master FPGA, a configuration code stream of corresponding configuration codes from the mass memory, configuring the FPGA chip under test via an external test interface, and determining whether the configuration is successful; if the configuration is successful, converting the configuration code stream into a test signal source file that is recognizable, executable and reusable by multiple pieces of test equipment by a developed algorithm and a conversion tool; and automatically loading the test signal source file onto the FPGA chip under test in real time by advanced test equipment.
机译:公开了一种用于使用凸块工艺的FPGA芯片的配置和测试方法及系统,该方法包括为被测FPGA芯片创建配置文件并将其存储在存储器中;主FPGA从大容量存储器中读取对应配置代码的配置代码流,并通过外部测试接口对被测FPGA芯片进行配置,并确定配置是否成功;如果配置成功,则通过开发的算法和转换工具,将配置代码流转换为测试信号源文件,该测试信号源文件可以被多台测试设备识别,执行和重用;并通过先进的测试设备将测试信号源文件实时自动加载到被测FPGA芯片上。

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