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HIGH-PURITY TIN OR TIN ALLOY AND PROCESS FOR PRODUCING HIGH-PURITY TIN

机译:高纯锡或锡合金及其生产高纯锡的方法

摘要

Provided is high purity tin or tin alloy wherein the respective contents of U and Th are 5ppb or less, the respective contents of Pb and Bi are 1 ppm or less, and the purity is 5N or higher (provided that this excludes the gas components of O, C, N, H, S and P). This high purity tin or tin alloy is characterized in that the ± ray count of high purity tin having a cast structure is 0.001 cph/cm 2 or less. Since recent semiconductor devices are densified and are of large capacity, there is considerable risk of a soft error occurring due to the influence of the ± ray from materials in the vicinity of the semiconductor chip. In particular, there are strong demands for purifying the soldering material or tin to be used in the vicinity of semiconductor devices, as well as for materials with fewer ± rays. Thus, the present invention aims to provide high purity tin or tin alloy and the manufacturing method of such high purity tin by reducing the ± dose of tin so as to be adaptable as the foregoing material.
机译:提供高纯度锡或锡合金,其中U和Th各自的含量为5ppb或更少,Pb和Bi各自的含量为1 ppm或更少,并且纯度为5N或更高(前提是排除了其中的气体成分) O,C,N,H,S和P)。该高纯度锡或锡合金的特征在于,具有铸造结构的高纯度锡的±射线计数为0.001cph / cm 2以下。由于近来的半导体器件被致密化并且具有大容量,由于来自半导体芯片附近的材料的±射线的影响,存在发生软错误的相当大的风险。特别地,强烈需要纯化用于半导体器件附近的焊接材料或锡以及具有较少±射线的材料。因此,本发明旨在通过减少锡的±剂量来提供高纯度的锡或锡合金及其制造方法,以适于用作前述材料。

著录项

  • 公开/公告号KR100958652B1

    专利类型

  • 公开/公告日2010-05-20

    原文格式PDF

  • 申请/专利权人

    申请/专利号KR20087001110

  • 申请日2006-06-14

  • 分类号C25C1/14;C22C13;C22B25/08;

  • 国家 KR

  • 入库时间 2022-08-21 18:31:15

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