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HIGH-PURITY TIN OR TIN ALLOY AND PROCESS FOR PRODUCING HIGH-PURITY TIN

机译:高纯锡或锡合金及其生产高纯锡的方法

摘要

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
机译:在U和TH的相对含量为5PPB或更少,PB和BI的相对含量为1PPM或更少且纯度为5N或更高的条件下提供的高纯度锡或锡合金(提供,其中不包括气体成分) ,C,N,H,S和P)。这种高纯度锡或锡合金的特征在于具有铸造结构的高纯度锡的射线数为0.001CPH / CM2或更低。由于半导体器件的密度最近并且具有大容量,因此,由于材料的射线对半导体芯片的影响,因此存在相当大的软错误风险。尤其是,对于在半导体设备附近以及在射线较少的材料中使用的焊接材料或锡的纯化存在强烈的需求。因此,本发明旨在提供高纯度的锡或锡合金,并且通过减少锡的剂量以使其适合作为前述材料来制造这种高纯度的锡。

著录项

  • 公开/公告号MY144943A

    专利类型

  • 公开/公告日2011-11-30

    原文格式PDF

  • 申请/专利权人 JX NIPPON MINING & METALS CORP;

    申请/专利号MY2007PI02324

  • 发明设计人 YUICHIRO SHINDO;KOUICHI TAKEMOTO;

    申请日2007-12-24

  • 分类号C25C1/14;C22B25/08;C22C13/00;

  • 国家 MY

  • 入库时间 2022-08-21 17:22:34

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