A method for measuring a characteristic of a capacitive sensor, the apparatus for measuring a sensor characteristic, capacitive sensor and ic - chip to the measurement of a sensor characteristic

摘要

The method of the assessment lens of the state of the movable electrode of a capacitive sensor (107), which has a detecting capacitor (108), of a movable electrode (108b) and one of the movable electrode opposite fixed electrode (108a), and a reference capacitor (110), which has an upper electrode (110b) and a lower electrode (110a), comprising the steps of:(a) applying a first predetermined voltage to the movable and stationary electrode of the detection capacitor as well as on the upper and lower electrode of the reference capacitor;(b) detecting a first difference between the capacitance between the measuring capacitor and the reference capacitor, after the first predetermined voltage has been applied;(c) applying a second predetermined voltage to the movable and stationary electrode of the detection capacitor as well as on the upper and lower electrode of the reference capacitor;(d) detecting a second difference between the capacitance between the measuring capacitor and the reference capacitor, after the second predetermined voltage has been applied;(e) achieve a third difference between the..