Metallic surface probe for electrical alternating fields in close range of magnetic field sensor, comprises insulating structure so that no circular areas are projected in remaining electrically conductive laminar structure

摘要

The metallic surface probe comprises an insulating structure so that no circular areas are projected in the remaining electrically conductive laminar structure, whose diameter is larger than the maximum wavelength to be measured with the H-field sensor located in the close range divided by one thousand. The metallic surface probe is about a tree structure which contacts the downstream circuit in its stem.