A method for the determination of phase and / or amplitude between the interfering adjacent x-rays in a detector pixels in the case of a talbot - interferometer

摘要

The invention relates to a method for the determination of phase (x₀) and / or amplitude (i_amp) between the interfering adjacent x-rays in a detector pixels in the case of a talbot - interferometer to the projective and tomographic x-ray - phase contrast - and / or x-ray - dark field - imaging, wherein after an irradiation of the object to be examined (o) with at least two coherent or quasi-coherent x-rays (s1, s2), an interference of at least two coherent or quasi-coherent x-rays is irradiated with the aid of a phase grating (g1) is produced, and the change of a plurality of temporally successive intensity measurements behind an analysis grid (g2) in relation to known relative displacements in the beam path in front of one of the grating (g2 or g1 or g0) or a grid-like x-ray source to the or the other gratings (g0, g1 bz. G0, g2) is determined.Brief according to the integrating intensity measurements during a relative movement - i.e, not during the standstill - one of the upstream grid (g2, g1, g0) or of the grid-like x-ray source or of the object to be examined with a known speed rate (v (t), v (x)) over a finite time interval (δt) or a finite distance (δx).