Differential Phase X-ray Imaging Microscopy With X-ray Talbot Interferometer

摘要

A new type of differential phase X-ray imaging microscopy attained by combination of an X-ray imaging microscope and an X-ray Talbot interferometer is described. An X-ray Talbot interferometer was set up so that a moire-fringe pattern appeared on the image plane of an X-ray imaging microscope. The wavefront inclination (differential phase shift) caused by a weakly absorbing polymer sample was measured from the fringes using the fringe-scanning method and with a spatial resolution of 1μm. Phase tomography was also performed and the internal structures of a piece of polymer blend were depicted.