A method and apparatus for estimating a position of a depend remain - defect in a scan chain of a test object

摘要

A method for estimating a position of a depend remain - defect in a scan chain of a test object, comprising:while a scanning pattern is displaced out of the scan chain, in real time evaluation of the scan pattern with respect to a presence of a logic condition;Maintaining a reference to a part of the scan pattern, the currently is evaluated;on an identifying the presence of the logic condition when the reference a predetermined relationship to a stored value, overwriting the stored value with the use of the reference; andUse of the stored value by the position of the hang remain - defect in the scan chain to be estimated.