首页> 外国专利> Direct converting detector element for detector of detector module for detecting X-ray radiation for computer tomography scanner, has diode made of semiconductor material whose hardness is selected from specific periods of periodic table

Direct converting detector element for detector of detector module for detecting X-ray radiation for computer tomography scanner, has diode made of semiconductor material whose hardness is selected from specific periods of periodic table

机译:用于计算机断层扫描仪的用于检测X射线辐射的检测器模块的检测器的直接转换检测器元件,具有由半导体材料制成的二极管,其硬度可从周期表的特定时间段中选择

摘要

The element (11) has strip-type diodes aligned according to an installation situation of the element with a diode longitudinal direction along an emission direction (13). Each diode is made of semiconductor material i.e. gallium arsenide, whose hardness is more than 1 percent of a mass fraction occurring element and selected from 4 periods of the periodic table. The diode includes a PN-junction aligned across the diode longitudinal direction, where reverse voltage of the diode is designed as 50 to 500 volts. An independent claim is also included for a detector module including a power supply system.
机译:元件(11)具有带状的二极管,该带状的二极管根据元件的安装状况而沿着发射方向(13)具有二极管的纵向方向。每个二极管均由半导体材料(即砷化镓)制成,其硬度大于发生质量分数元素的1%,并且选自周期表的4个周期。二极管包括沿二极管纵向排列的PN结,其中二极管的反向电压设计为50至500伏。对于包括电源系统的检测器模块也包括独立权利要求。

著录项

  • 公开/公告号DE102009008702A1

    专利类型

  • 公开/公告日2010-08-26

    原文格式PDF

  • 申请/专利权人 SIEMENS AKTIENGESELLSCHAFT;

    申请/专利号DE20091008702

  • 发明设计人 KRAUS BERNHARD;

    申请日2009-02-12

  • 分类号G01T1/24;G01T1/29;H01L31/115;

  • 国家 DE

  • 入库时间 2022-08-21 18:28:24

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