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FIZEAU INTERFEROMETER AND MEASUREMENT METHOD FOR FIZEAU INTERFEROMETER

机译:FIZEAU干涉仪及FIZEAU干涉仪的测量方法

摘要

PPROBLEM TO BE SOLVED: To provide a Fizeau interferometer properly measuring the form of a spherical surface to be measured even in the case where a phase shift method is used. PSOLUTION: The Fizeau interferometer 1 is equipped with: an interferometer body 2; and a measuring apparatus 3. The interferometer body 2 is equipped with an optical system 22 comprising a reference spherical surface or the like. The measuring apparatus 3 includes an intensity obtaining section 31 and a form calculating section 32. The intensity obtaining section 31 obtains the intensities of interference light in n positions at equal intervals while the position of the reference spherical surface at the time when the focal point of the reference spherical surface is aligned with the focal point of the spherical surface to be measured is set as the center position and the two positions equidistant from the center position are set as the start position and the end position, respectively. The form calculating section 32 measures the form of the spherical surface to be measured using an algorithm of a phase shift method, wherein a coefficient of the intensity of the interference light in an i-th position and a coefficient of the intensity of interference light in an (n-i+1)th position have the same value. PCOPYRIGHT: (C)2011,JPO&INPIT
机译:

要解决的问题:即使在使用相移方法的情况下,也要提供一种Fizeau干涉仪,以正确地测量要测量的球面的形状。

解决方案:Fizeau干涉仪1配备:干涉仪主体2;干涉仪主体2配备有包括基准球面等的光学系统22。测量设备3包括强度获取部分31和形式计算部分32。强度获取部分31以相等的间隔获取n个位置处的干涉光的强度,而在该位置处基准球面的位置在将基准球面与要测量的球面的焦点对准,将其设置为中心位置,将与中心位置等距的两个位置分别设置为开始位置和结束位置。形状计算部32使用相移法的算法来测量要测量的球面的形状,其中,在第i个位置处的干涉光的强度系数和在第i个位置处的干涉光的强度系数第(n-i + 1)个位置的值相同。

版权:(C)2011,日本特许厅&INPIT

著录项

  • 公开/公告号JP2011122829A

    专利类型

  • 公开/公告日2011-06-23

    原文格式PDF

  • 申请/专利权人 MITSUTOYO CORP;

    申请/专利号JP20090278218

  • 申请日2009-12-08

  • 分类号G01B9/02;G01B11/24;

  • 国家 JP

  • 入库时间 2022-08-21 18:23:31

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