首页>
外国专利>
EMISSION INTENSITY MEASUREMENT METHOD, EMISSION INTENSITY MEASUREMENT DEVICE AND COMPUTER PROGRAM
EMISSION INTENSITY MEASUREMENT METHOD, EMISSION INTENSITY MEASUREMENT DEVICE AND COMPUTER PROGRAM
展开▼
机译:发射强度的测定方法,发射强度的测定装置及计算机程序
展开▼
页面导航
摘要
著录项
相似文献
摘要
PROBLEM TO BE SOLVED: To provide an emission intensity measurement method, an emission intensity measurement device and a computer program capable of precisely estimating an emission intensity from a display surface of a display panel even when either the display panel or a backlight is changed by aging.;SOLUTION: A personal computer (PC) emits backlight with a predetermined emission intensity, successively detects emission intensity of the peripheral part of the display surface 2 and emission intensity of the central part of the display surface 2 when being set on each gradation level and stores correlation information which allows the detected values to correlate to one another onto a correlation table beforehand. The PC produces the correlation information in accordance with the light amount of the backlight upon calibration from the correlation information which is stored beforehand on the correlation table when calibrating a gradation characteristic of a liquid crystal panel. Therein, the PC detects the emission intensity of the peripheral part of the display surface 2 with a swing sensor 30 and calculates the emission intensity on the center part of the display surface 2 based on the detected emission intensity of the peripheral part and the produced correlation information.;COPYRIGHT: (C)2011,JPO&INPIT
展开▼