FACILITIES AND METHOD FOR INSPECTING LIGHTING OF ORGANIC EL DISPLAY SUBSTRATE, DEVICE AND METHOD FOR INSPECTING/CORRECTING DEFECT IN ORGANIC EL DISPLAY SUBSTRATE, AND SYSTEM AND METHOD FOR MANUFACTURING ORGANIC EL DISPLAY

摘要

PROBLEM TO BE SOLVED: To provide a facility or a method for inspecting lighting of an organic EL display substrate that can recover pixel defects even if a final panel has a resin-sealing structure, has high pixel reliability after defect correction or has short processing time for inspection/correction, or has a high success rate for defect correction, and can be automated for high productivity, to provide a device or a method for inspecting/correcting defects in an organic EL display substrate, or to provide a system and/or a method for manufacturing the organic EL display.;SOLUTION: To light each pixel, power is fed to an exclusive electrode pad of a mother board including exclusive wiring and an exclusive electrode pad for inspecting lighting for lighting each pixel of the organic EL element and a non-lit defective pixel and its position are detected from among the respective pixels based on the lighting result. Then, laser beams are applied to a foreign matter of the defective pixel before sealing to recover the defect.;COPYRIGHT: (C)2011,JPO&INPIT