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The optical device in order to irradiate to suffering measurement ones, and the interference measurement equipment in order to measure the aspect of suffering measurement ones

机译:为了照射到被测者的光学设备,以及为了被测者的方面而测量的干涉测量设备

摘要

This invention had the optical device (200), suffering measurement ones (280) the surface (281,282) the interference measurement equipment for measurement (300) it regards. The aforementioned optical device (200), the measurement beam of the 1st optical path and the measurement beam of the 2nd optical path the aspect of aforementioned suffering measurement ones (281,282) bimusupuritsuta in order to make advance (250) it possesses two mirrors (260,270) with. The optical path which is formed the aforementioned surface (281,282) with by the light beam which is reflected to be piled up at least partly mutually in the territory where it becomes the same emission direction. Suffering measurement ones (280) the suffering measuring plane (281,282) partly, the detector (90) image formation it does at least in the same lighting aspect this way, image formation it does for example in the image pickup vessel.
机译:本发明具有光学装置(200),使测量装置(280)的表面(281,282)受到其所涉及的测量用干涉测量装置(300)的影响。为了使(250)前进,上述光学装置(200),第一光路的测量光束和第二光路的测量光束为了承受(250)而具有两个反射镜(260,270)。 )。由反射的光束形成在上述表面(281,282)上的光路在其成为相同发射方向的区域中至少部分地相互堆叠。遭受测量的物体(280)和遭受测量的平面(281,282)的一部分,检测器(90)至少以这种方式在相同的照明方式下进行成像,例如在摄像容器中进行成像。

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