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Temperature / thickness measuring device, temperature / thickness measurement method, temperature / thickness measurement system, control system, control method

机译:温度/厚度测量装置,温度/厚度测量方法,温度/厚度测量系统,控制系统,控制方法

摘要

PROBLEM TO BE SOLVED: To provide a measuring device capable of measuring temperature or thickness of a plurality of objects to be measured at once, without forming hole, through which measuring light pass to each object to be measured to avoid the trouble of having to install a device.;SOLUTION: The temperature/thickness measuring device is equipped with an illuminant 110 irradiating light of wavelength possible of transmitting through and reflected from each object to be measured T1 to Tn, a splitter 120 splitting the light from the illuminant into measuring light and reference light, a reference light reflecting means 140 (for example, reference mirror) reflecting the reference light from the splitter, an optical length modulating means (for example, a driving means driving the reference mirror) 142 modulating optical length of the reference light reflected from the reference light reflecting means, and an optical receiver 150 measuring interference of light between the reference light reflected from the reference light reflecting means for irradiation with the reference light from the splitter toward the reference light reflecting means and each measuring light reflected from each object to be measured for irradiation with measuring light from the splitter toward a plurality of objects to be measured so as to transmit through each object to be measured.;COPYRIGHT: (C)2006,JPO&NCIPI
机译:解决的问题:提供一种能够在不形成孔的情况下一次测量多个被测量物的温度或厚度的测量装置,测量光穿过该测量装置而到达每个被测量物,从而避免了必须安装的麻烦。解决方案:温度/厚度测量设备配备有光源110,该光源110照射可能透射和反射每个待测物体T 1 至T n <的波长的光。 / Sub>,将来自光源的光分离为测量光和参考光的分离器120,反射来自分离器的参考光的参考光反射装置140(例如,参考镜),光学长度调制装置(例如, (驱动参考镜的驱动装置)142调制从参考光反射装置反射的参考光的光学长度,以及测量光下注的干涉的光接收器150在从参考光反射装置反射的用于从分束器朝参考光反射装置照射的参考光的参考光与从每个被测量物反射的每个测量光之间,用于从分离器向多个物体照射的测量光。以便通过每个被测物体传输。版权所有:(C)2006,JPO&NCIPI

著录项

  • 公开/公告号JP4761774B2

    专利类型

  • 公开/公告日2011-08-31

    原文格式PDF

  • 申请/专利权人 東京エレクトロン株式会社;

    申请/专利号JP20050005309

  • 发明设计人 鈴木 智博;輿水 地塩;

    申请日2005-01-12

  • 分类号G01K11/12;G01B11/06;

  • 国家 JP

  • 入库时间 2022-08-21 18:19:27

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