The ion trap which the ion which the ion trap/the duration of flight die mass spectrometry device

摘要

PROBLEM TO BE SOLVED: To provide an ion trap TOF/MS enabling an observation output correction of the ion trap and the TOF.;SOLUTION: Sample ion with a known mass number ionized by an ion source is trapped by the ion trap, a subsidiary alternate current voltage having a frequency component ω is impressed on an end-cap electrode of the ion trap to exhaust unnecessary ion inside the ion trap, and the ion remaining inside the ion trap is exhausted by impressing direct current voltage on a ring electrode and the end-cap electrode to carry out a measurement treatment measuring with the time-of-flight mass spectrometer. By repeating the measurement treatment by varying the frequency component ω and comparing a signal strength measured by the time-of-flight mass spectrometer with a pre-recorded threshold value, correction of the frequency component is carried out against the ion of the known mass number. In doing so, the observation mass correction of the TOF and the ion trap can be carried out.;COPYRIGHT: (C)2006,JPO&NCIPI