Were used with the interferometer of a single arm and the interference pattern of three waves, a system and method for determining the chromatic dispersion of a short waveguide

摘要

The present invention relates to a method and system for measuring chromatic dispersion using the interferometer of a single arm and interference phenomena of three waves, in the short waveguide. The present invention, and the incident and reflected waves having a light source connected to the means for separating the incident and reflected waves, which emits light, and an output arm which is adjacent the terminal end of the first waveguide, especially means for separating, the detector connected to the means for separating the incident and reflected waves, a collimator means located at the end of the second waveguide is located in the distance equilibrated from the collimator means, reflections back is allowed to pass through and means for reflecting the radiation trial from the light source, separating the collimator unit, a waveguide, and the incident and reflected waves, to produce an interference pattern recorded by the detector and is characterized in that it contains means. [Selection Figure 11