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The sample holder and the survey instrument and the mount section which possesses

机译:样品架和检验仪器以及具有的安装部分

摘要

PROBLEM TO BE SOLVED: To solve the problem that dust floating towards a sample cannot be removed and an electric circuit is damaged fatally as seen in a short circuit or the like between circuit patterns in a method for removing dust using an electrostatic attraction.;SOLUTION: A sample holder has a placing base 12 with the placed sample 11 for an inspection or an observation; a first electrode 13 applying a positive or negative voltage to a reference potential to the sample 11; and a second electrode 18 to which a voltage having a reverse value to the positive or negative voltage to the applied voltage of the first electrode 13 and having the same as or larger than an absolute value is applied, and which is arranged around the placing base 12 while being separated from the first electrode 13. Dust intended towards the inside of the second electrode 18 and being charged in the same code as the second electrode 18 receives an electrostatic repulsive force by the sample holder, and is returned outside the second electrode 18, thus reducing the attraction of dust onto the sample 11.;COPYRIGHT: (C)2007,JPO&INPIT
机译:解决的问题:为了解决以下问题:在利用静电吸引的除尘方法中,如从电路图案之间的短路等中看到的那样,无法去除浮向样本的浮尘并且致命地损坏电路。 :样品架具有放置基座12,该放置基座12具有用于检查或观察的放置样本11;第一电极13将正或负电压施加到样品11的参考电位。第二电极18被布置在放置基座周围,第二电极18被施加具有与第一电极13的施加电压的正电压或负电压相反的值并且具有等于或大于绝对值的电压。在与第一电极13分离的同时,图12所示的灰尘朝向第二电极18的内部并且以与第二电极18相同的代码被充电,该灰尘被样品保持器接收静电排斥力,并返回到第二电极18的外部。 ,从而减少了灰尘对样品11的吸引。;版权所有:(C)2007,日本特许厅&INPIT

著录项

  • 公开/公告号JP4663406B2

    专利类型

  • 公开/公告日2011-04-06

    原文格式PDF

  • 申请/专利权人 京セラ株式会社;

    申请/专利号JP20050157069

  • 发明设计人 宗石 猛;

    申请日2005-05-30

  • 分类号H01L21/66;

  • 国家 JP

  • 入库时间 2022-08-21 18:17:23

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