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Silicon carbide and radiation method of detection for radiation detection element

机译:碳化硅和放射线检测元件的放射线检测方法

摘要

The element for radiation detection is offered. It is high purity and it uses SiC which possesses semi-insulating as the element for radiation detection. Radius electrode as a detection aspect of the x-ray of the circular condition of 1.25mm 2 is formed on the surface of one side of SiC1. Electrode 3 is formed in the central part of the other aspect of SiC1, electrode specified direct current voltage is impressed between 2 and 3. You can gather the electron which is formed inside SiC1 by the x-ray which incidence is done in electrode 2 in electrode 3, the electric information is output from electrode 3 to amplifier 20. Amplifier 20 expanding the electric information which is input, the voltage which responds to the number of electrons which are formed to the multiplex peak analyzer outputs.
机译:提供用于辐射检测的元件。高纯度,使用具有半绝缘性的SiC作为放射线检测元素。在SiCl的一侧的表面上形成有作为圆形条件的1.25mm 2的x射线的检测方式的半径电极。电极3形成在SiC1另一端的中央,电极指定的直流电压施加在2和3之间。通过入射在电极2中的X射线,可以收集在SiC1内部形成的电子。在电极3上,电信息从电极3输出到放大器20。放大器20扩展输入的电信息,该电压响应于形成在多路复用峰值分析器上的电子数量。

著录项

  • 公开/公告号JPWO2009022377A1

    专利类型

  • 公开/公告日2010-11-11

    原文格式PDF

  • 申请/专利权人 学校法人 大阪電気通信大学;

    申请/专利号JP20080558133

  • 发明设计人 松浦 秀治;

    申请日2007-08-10

  • 分类号H01L31/09;G01T1/24;

  • 国家 JP

  • 入库时间 2022-08-21 18:16:44

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