首页> 外国专利> FIELD EFFECT TRANISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, MANUFACTURING METHOD OF FIELD EFFECT TRANSISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, AND MANUFACTURING METHOD OF AMORPHOUS OXIDE FILM

FIELD EFFECT TRANISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, MANUFACTURING METHOD OF FIELD EFFECT TRANSISTOR USING AMORPHOUS OXIDE FILM AS CHANNEL LAYER, AND MANUFACTURING METHOD OF AMORPHOUS OXIDE FILM

机译:以非晶态氧化物膜为通道层的场效应晶体管,以非晶态氧化物膜为通道层的场效应晶体管的制造方法以及非晶态氧化物膜的制造方法

摘要

An amorphous oxide containing hydrogen (or deuterium) is applied to a channel layer of a transistor. Accordingly, a thin film transistor having superior TFT properties can be realized, the superior TFT properties including a small hysteresis, normally OFF operation, a high ON/OFF ratio, a high saturated current, and the like. Furthermore, as a method for manufacturing a channel layer made of an amorphous oxide, film formation is performed in an atmosphere containing a hydrogen gas and an oxygen gas, so that the carrier concentration of the amorphous oxide can be controlled.
机译:将包含氢(或氘)的非晶氧化物施加到晶体管的沟道层。因此,可以实现具有优良的TFT特性的薄膜晶体管,该优良的TFT特性包括小的滞后,常关操作,高开/关比,高饱和电流等。此外,作为用于制造由非晶氧化物制成的沟道层的方法,在包含氢气和氧气的气氛中执行膜形成,从而可以控制非晶氧化物的载流子浓度。

著录项

  • 公开/公告号US2011193082A1

    专利类型

  • 公开/公告日2011-08-11

    原文格式PDF

  • 申请/专利权人 TATSUYA IWASAKI;

    申请/专利号US201113089703

  • 发明设计人 TATSUYA IWASAKI;

    申请日2011-04-19

  • 分类号H01L29/04;

  • 国家 US

  • 入库时间 2022-08-21 18:16:24

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