首页> 外国专利> METHODS FOR FORMING BARRIER REGIONS WITHIN REGIONS OF INSULATING MATERIAL RESULTING IN OUTGASSING PATHS FROM THE INSULATING MATERIAL AND RELATED DEVICES

METHODS FOR FORMING BARRIER REGIONS WITHIN REGIONS OF INSULATING MATERIAL RESULTING IN OUTGASSING PATHS FROM THE INSULATING MATERIAL AND RELATED DEVICES

机译:在从绝缘材料和相关设备的外出路径中产生绝缘材料的区域内形成障碍区域的方法

摘要

Methods and devices are provided for fabricating a semiconductor device having barrier regions within regions of insulating material resulting in outgassing paths from the regions of insulating material. A method comprises forming a barrier region within an insulating material proximate the isolated region of semiconductor material and forming a gate structure overlying the isolated region of semiconductor material. The barrier region is adjacent to the isolated region of semiconductor material, resulting in an outgassing path within the insulating material.
机译:提供了用于制造半导体器件的方法和器件,该半导体器件在绝缘材料的区域内具有阻挡区域,从而导致从绝缘材料的区域脱气。一种方法包括:在绝缘材料内靠近半导体材料的隔离区的区域中形成阻挡区;以及形成覆盖半导体材料的隔离区的栅极结构。势垒区域与半导体材料的隔离区域相邻,从而导致绝缘材料内的排气路径。

著录项

  • 公开/公告号US2011198694A1

    专利类型

  • 公开/公告日2011-08-18

    原文格式PDF

  • 申请/专利权人 MAN FAI NG;BIN YANG;

    申请/专利号US20100707150

  • 发明设计人 BIN YANG;MAN FAI NG;

    申请日2010-02-17

  • 分类号H01L27/12;H01L21/762;

  • 国家 US

  • 入库时间 2022-08-21 18:16:01

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