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SYSTEMS AND METHODS FOR EFFICIENTLY REPAIRING DYNAMIC RANDOM-ACCESS MEMORY HAVING MARGINALLY FAILING CELLS
SYSTEMS AND METHODS FOR EFFICIENTLY REPAIRING DYNAMIC RANDOM-ACCESS MEMORY HAVING MARGINALLY FAILING CELLS
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机译:有效修复具有边缘衰落细胞的动态随机访问存储器的系统和方法
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摘要
A test system and a method for efficiently repairing marginally failing memory cells in an embedded dynamic random access memory on an integrated circuit identify marginally failing cells in the embedded memory and when two or more marginally failing cells are located in the same column, indicating a partial column failure due to a weak sense amplifier associated with the column, the system and method apply a spare column preferentially to repair the failing cells in the column The test system can be arranged in a built-in self test engine on the integrated circuit. In an alternative embodiment, the test system can be implemented in test equipment coupled to the integrated circuit that houses the embedded dynamic random-access memory.
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