DEVICE FOR THE INVESTIGATION OF TEXTURED SURFACES

摘要

A method for the optical investigation of textured surfaces (10) with the steps:irradiation of radiation onto the surface (10) to be investigated;reception of an image from at least part of the radiation irradiated onto the surface (10) and reflected by the surface (10);location-resolved evaluation of the image recorded and determination of at least one value (K) which is characteristic of this image.;According to the invention a parameter (G) which is characteristic of the surface is determined whilst using the characteristic value (K) and whilst using at least one further property (E)—known beforehand or determined—of the surface (10).