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Semiconductor Device Having Solder-Free Gold Bump Contacts for Stability in Repeated Temperature Cycles

机译:具有免焊金凸点触点的半导体器件可在重复的温度循环中保持稳定

摘要

A semiconductor device has a chip (101) with gold studs (212) assembled on a tape substrate (102), which has solder balls (103) for attachment to external parts. The tape substrate (about 30 to 70 μm thick) has on its first surface first copper contact pads (221) covered with a continuous thin nickel layer (222) of about 0.04 to 0.12 μm thickness. Gold including stud (212) is contacting the nickel. On the second substrate surface are second copper contact pads (231) covered with an alloy layer (about 2 to 3 μm thick) including gold, copper/tin alloys, and copper/nickel/tin alloys; the alloys are metallurgically attached to the second copper pad and substantially free of unalloyed nickel. A reflow body (103) comprising tin is metallurgically attached to the alloy layer of each second pad.
机译:半导体器件的芯片( 101 )上有金钉( 212 )组装在带状基板( 102 )上,该带状基板上有焊球( 103 )以连接到外部零件。胶带基板(约30至70μm厚)在其第一表面上具有覆盖有约0.04的连续薄镍层( 222 )的第一铜接触垫( 221 )至0.12μm的厚度。包括双头螺栓( 212 )的金与镍接触。在第二基板表面上是第二铜接触垫( 231 ),其覆盖有包括金,铜/锡合金和铜/镍/锡合金的合金层(约2至3μm厚);合金冶金地附着到第二铜垫上,并且基本上没有未合金化的镍。包含锡的回流体( 103 )以冶金方式附着到每个第二焊盘的合金层。

著录项

  • 公开/公告号US2011045641A1

    专利类型

  • 公开/公告日2011-02-24

    原文格式PDF

  • 申请/专利权人 MUTSUMI MASUMOTO;

    申请/专利号US20100917620

  • 发明设计人 MUTSUMI MASUMOTO;

    申请日2010-11-02

  • 分类号H01L21/58;

  • 国家 US

  • 入库时间 2022-08-21 18:13:23

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