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System for creating an inspection recipe, system for reviewing defects, method for creating an inspection recipe and method for reviewing defects

机译:用于创建检查配方的系统,用于检查缺陷的系统,用于创建检查配方的方法和用于检查缺陷的方法

摘要

A system for creating an inspection recipe, includes an inspection target selection module selecting an inspection target; a critical area extraction module extracting corresponding critical areas for defect sizes in the inspection target; a defect density prediction module extracting corresponding defect densities predicted by defects to be detected in the inspection target for the defect sizes; a killer defect calculation module calculating corresponding numbers of killer defects in the defect sizes based on the critical areas and the defect densities; and a detection expectation calculation module calculating another numbers of the killer defects expected to be detected for prospective inspection recipes determining rates of defect detection for the defect sizes, based on the numbers of the killer defects and the rates of defect detection prescribed in the prospective inspection recipes.
机译:一种创建检查配方的系统,包括:检查目标选择模块,用于选择检查目标;关键区域提取模块提取对应于检查对象缺陷尺寸的关键区域;缺陷密度预测模块提取缺陷尺寸的检查目标中待检测缺陷所预测的相应缺陷密度;杀手缺陷计算模块,根据临界面积和缺陷密度,计算出缺陷尺寸对应的杀手缺陷数量。检测期望计算模块基于预期检验中规定的致命缺陷数量和缺陷检测率,计算预期用于预期检验配方的其他数量的致命缺陷,以确定缺陷尺寸的缺陷检测率。食谱。

著录项

  • 公开/公告号US2011001820A1

    专利类型

  • 公开/公告日2011-01-06

    原文格式PDF

  • 申请/专利权人 YOSHIYUKI SATO;

    申请/专利号US20100801865

  • 发明设计人 YOSHIYUKI SATO;

    申请日2010-06-29

  • 分类号H04N7/18;

  • 国家 US

  • 入库时间 2022-08-21 18:10:20

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