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Method and system for performing sequential equivalence checking on integrated circuit (IC) designs

机译:在集成电路(ic)设计上执行顺序等效检查的方法和系统

摘要

One embodiment of the present invention provides a system that performs sequential equivalence checking between integrated circuit (IC) designs. During operation, the system receives a first IC design and a second IC design. Each of the first and second IC designs includes a top design level and a bottom design level, and the bottom design levels include one or more sub-blocks within the corresponding top design levels. The system then verifies if each of the sub-blocks in the bottom design level of the first design is conditionally equivalent to a corresponding sub-block in the second design. Note that two designs are conditionally equivalent if the two designs can become sequentially equivalent by adding registers on the input and output ports of the two designs. The system additionally verifies if the top design level of the first design is conditionally equivalent to the top design level of the second design and if the first design is temporally equivalent to the second design.
机译:本发明的一个实施例提供了一种在集成电路(IC)设计之间执行顺序等效检查的系统。在操作期间,系统接收第一IC设计和第二IC设计。第一和第二IC设计中的每一个均包括顶部设计等级和底部设计等级,并且底部设计等级包括在相应的顶部设计等级内的一个或多个子块。然后,系统验证第一设计的底部设计级别中的每个子块是否在条件上等同于第二设计中的相应子块。请注意,如果通过在两个设计的输入和输出端口上添加寄存器可以使两个设计顺序地等效,则两个设计在条件上等效。该系统还验证第一设计的最高设计级别是否有条件地等效于第二设计的最高设计级别,以及第一设计在时间上是否等效于第二设计。

著录项

  • 公开/公告号US8015521B2

    专利类型

  • 公开/公告日2011-09-06

    原文格式PDF

  • 申请/专利权人 IN-HO MOON;

    申请/专利号US20080181638

  • 发明设计人 IN-HO MOON;

    申请日2008-07-29

  • 分类号G06F17/50;G06F9/455;

  • 国家 US

  • 入库时间 2022-08-21 18:08:48

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