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Method to identify timing violations outside of manufacturing specification limits
Method to identify timing violations outside of manufacturing specification limits
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机译:识别超出制造规范限制的时序违规的方法
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摘要
A method of evaluating an integrated circuit design selects manufacturing parameters of interest which are outside of manufacturing specification limits. Then, the method runs timing tests on the integrated circuit design and successively evaluates the timing test results in an iterative process that considers the timing performance sensitivity to the selected manufacturing parameters of interest. The design is made more robust to each parameter out of manufacturing range.
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