首页> 外国专利> Method and system for measuring the fluorescence lifetime in the frequency domain with high levels of background signal.

Method and system for measuring the fluorescence lifetime in the frequency domain with high levels of background signal.

机译:在具有高水平背景信号的情况下在频域中测量荧光寿命的方法和系统。

摘要

Method of measuring the fluorescence lifetime in the frequency domain with high levels of background signal.; Measuring the average lifetime of fluorescent emission in the frequency domain it is hampered by the presence of background signals. a method is proposed for detecting said lifetime even when the fluorescence is much lower than the bottom, without requiring a calibration sample, based on the measurement corresponding to different modulation frequencies of the excitation signal. By doing this, the background signal remains constant, while the signal interest rate changes. The signal of interest can be recovered by performing a cancellation of the common signal. This technique can be used to eliminate the effect of light scattered excitation and autofluorescence.
机译:用高水平背景信号测量频域中荧光寿命的方法。在频域中测量荧光发射的平均寿命受到背景信号的影响。提出了一种基于与激发信号的不同调制频率相对应的测量结果来检测所述寿命的方法,该方法即使在荧光远低于底部时也不需要校准样品。通过这样做,背景信号保持恒定,而信号利率改变。感兴趣的信号可以通过执行公共信号的消除来恢复。该技术可用于消除光散射激发和自发荧光的影响。

著录项

  • 公开/公告号ES2342451B2

    专利类型

  • 公开/公告日2011-06-30

    原文格式PDF

  • 申请/专利权人 UNIVERSIDAD POLITECNICA DE MADRID;

    申请/专利号ES20090001614

  • 发明设计人 NAVARRO TOBAR ALVARO;

    申请日2009-07-20

  • 分类号G01N21/64;

  • 国家 ES

  • 入库时间 2022-08-21 18:02:51

相似文献

  • 专利
  • 外文文献
  • 中文文献
获取专利

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号