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phiFLIM: a new method to avoid aliasing in frequency domain fluorescence lifetime imaging microscopy.

机译:phiFLIM:一种避免频域荧光寿命成像显微镜中混叠的新方法。

摘要

In conventional wide-field frequency-domain fluorescence lifetime imaging microscopy (FLIM), excitation light is intensity-modulated at megahertz frequencies. Emitted fluorescence is recorded by a CCD camera through an image intensifier, which is modulated at the same frequency. From images recorded at various phase differences between excitation and intensifier gain modulation, the phase and modulation depth of the emitted light is obtained. The fluorescence lifetime is determined from the delay and the decrease in modulation depth of the emission relative to the excitation. A minimum of three images is required, but in this case measurements become susceptible to aliasing caused by the presence of higher harmonics. Taking more images to avoid this is not always possible owing to phototoxicity or movement. A method is introduced, FLIM, requiring only three recordings that is not susceptible to aliasing. The phase difference between the excitation and the intensifier is scanned over the entire 360? range following a predefined phase profile, during which the image produced by the intensifier is integrated onto the CCD camera, yielding a single image. Three different images are produced following this procedure, each with a different phase profile. Measurements were performed with a conventional wide-field frequency-domain FLIM system based on an acousto-optic modulator for modulation of the excitation and a microchannel-plate image intensifier coupled to a CCD camera for the detection. By analysis of the harmonic content of measured signals it was found that the third harmonic was effectively the highest present. Using the conventional method with three recordings, phase errors due to aliasing of up to ? 29? and modulation depth errors of up to 30% were found. Errors in lifetimes of YFP-transfected HeLa cells were as high as 100%. With FLIM, using the same specimen and settings, systematic errors due to aliasing did not occur.
机译:在常规的广域频域荧光寿命成像显微镜(FLIM)中,激发光以兆赫兹频率进行强度调制。 CCD照相机通过图像增强器记录发射的荧光,该图像增强器以相同的频率进行调制。从在激励和增强器增益调制之间的各种相位差处记录的图像中,可以获得发射光的相位和调制深度。荧光寿命由延迟和发射相对于激发的调制深度的减小来确定。至少需要三张图像,但是在这种情况下,测量容易受到由于高次谐波的存在而引起的混叠的影响。由于光毒或移动,并非总能拍摄更多图像来避免这种情况。引入了一种方法,即FLIM,它仅需要三个不易混叠的记录。激励和增强器之间的相位差在整个360?范围内进行扫描。在预定义的相位轮廓之后的最大范围内,其间将由增强器产生的图像集成到CCD摄像机中,从而产生单个图像。按照此步骤产生三个不同的图像,每个图像具有不同的相位轮廓。使用基于声光调制器(用于调制激发)和耦合至CCD相机(用于检测)的微通道板图像增强器的常规广域频域FLIM系统进行测量。通过分析测量信号的谐波含量,可以发现三次谐波实际上是最高的。使用具有三个记录的常规方法,由于混叠而导致的相位误差最大为。 29?发现调制深度误差高达30%。 YFP转染的HeLa细胞的寿命错误高达100%。使用FLIM,使用相同的样本和设置,不会发生由于混叠引起的系统错误。

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